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Noesis Advanced Waveform Management & DSP

 

 

The data stored in Acoustic Emission data files often contains a compressed form of the information (or parts of it) in the form of Acoustic Emission features extracted from waveforms and, thus, there is always some information loss. Waveforms are the complete information of the Acoustic Emission produced during an actual test or laboratory experiment. Fast, real time Acoustic Emission systems are required to retrieve and store waveform information. Noesis has full support for importing waveform information stored in PAC DTA, TDA or WFS acoustic emission data files from PCI-2, DiSP etc systems. In addition Noesis supports ASCII waveforms with the TXT module. With the Advanced Waveform Management functions in Noesis, these capabilities are dramatically enhanced offering many new functions. The viewing capabilities of waveforms are similar and as flexible as general data viewing graphs and they include FFT transformation, filtering, windowing and other tools to investigate the complete information of the received signal. Noesis offers a large array of functions starting from viewing capabilities (e.g. multiple waveform viewing, zooming etc.) to Waveform Feature Extraction both in time and frequency domains including some features unique to Noesis and multiple hit extraction per waveform. These can drastically improve the user's insight to data types and improve Pattern Recognition, utilizing the new unique features extracted from Noesis. For TDA files features can be extracted and a complete feature set created (with Time of arrival to any feature desired) rendering TDA files usable by any advanced feature (e.g. Pattern Recognition). The following is a brief list of the capabilities of Noesis in waveform handling :

• Waveforms can be displayed in any window view. Multiple waveforms can be displayed in any view. Waveform views are fully customizable.

• Advanced waveforms viewing including graphical filtering.

• 3D presentation of multiple waveforms or waveform FFTs.

• Digital Signal Processing on waveforms (FFT Real, Imaginary, Magnitude, Phase, Power Spectrum).

• Graphical and Box (Range) Zoom functions for all waveform and FFT views including selection range synchro, auto-scale, and user-range.

• Waveform filters can be applied to graphics or to feature extraction.

• RMS waveform calculation and Autocorrelation.

• Segment FFT views where the user can select a segment of the waveform and view the corresponding FFT, Power Spectrum etc. The Segment can be defined and used in Feature Extraction as well.

• Data selection from waveform views including logical modes.

• Individual waveform feature extraction with comparison table with existing features. For more information about complete file feature extraction see the Data Handling page.